DocumentCode :
3619508
Title :
Prediction of MOS Matching in Weak and Moderate Inversion from Threshold Matching in Strong Inversion
Author :
M. Denison;A. Pergoot;M. Tack
Author_Institution :
Alcatel Microelectronics, Oudenaarde, Belgium
fYear :
1998
fDate :
6/20/1905 12:00:00 AM
Firstpage :
648
Lastpage :
651
Keywords :
"Threshold voltage","CMOS technology","Semiconductor device modeling","Performance evaluation","Testing","Temperature","Microelectronics","Transconductance","Electric resistance","MOSFETs"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Print_ISBN :
2-86332-234-6
Type :
conf
Filename :
1503635
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619508
