مرکز منطقه ای اطلاع رساني علوم و فناوري - Analysis on the Avalanche Ruggedness of Finger Type and Stripe Type LDMOS Transistor

DocumentCode :

3619512

Title :

Analysis on the Avalanche Ruggedness of Finger Type and Stripe Type LDMOS Transistor

Author :

T.H. Kwon;Y.C. Choi;C.J. Kim;H.S. Kang;C.S. Song

Author_Institution :

Fairchild Korea Semiconductor Ltd., Kyunggi-Do, Korea

fYear :

2000

fDate :

6/22/1905 12:00:00 AM

Firstpage :

236

Lastpage :

239

Keywords :

"Fingers","Equivalent circuits","Diodes","Inductors","Voltage","Inductance","Immune system","Switching circuits","Avalanche breakdown","Shape"

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

Print_ISBN :

2-86332-248-6

Type :

conf

DOI :

10.1109/ESSDERC.2000.194758

Filename :

1503688

Link To Document :