• DocumentCode
    3619512
  • Title

    Analysis on the Avalanche Ruggedness of Finger Type and Stripe Type LDMOS Transistor

  • Author

    T.H. Kwon;Y.C. Choi;C.J. Kim;H.S. Kang;C.S. Song

  • Author_Institution
    Fairchild Korea Semiconductor Ltd., Kyunggi-Do, Korea
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    236
  • Lastpage
    239
  • Keywords
    "Fingers","Equivalent circuits","Diodes","Inductors","Voltage","Inductance","Immune system","Switching circuits","Avalanche breakdown","Shape"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194758
  • Filename
    1503688
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619512