3619523

New Shift-&-Ratio Leff extraction algorithm for Fully-Depleted SOI CMOS transistors

H. van Meer;K. De Meyer

IMEC, Leuven, Belgium

2000

6/22/1905 12:00:00 AM

348

351

"MOSFETs","Threshold voltage","Semiconductor films","Data mining","Silicon devices","Substrates","Circuit simulation","History","Design engineering","Hardware"

ieee

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

2-86332-248-6

conf

10.1109/ESSDERC.2000.194786

1503716