• DocumentCode
    3619527
  • Title

    RF Distortion Characterisation of Sub-Micron CMOS

  • Author

    L.F. Tiemeijer;R. van Langevelde;O. Gaillard;R.J. Havens;P.G.M. Baltus;P.H. Woerlee;D.B.M. Klaassen

  • Author_Institution
    Philips Research Laboratories, Eindhoven, The Netherlands
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    464
  • Lastpage
    467
  • Keywords
    "Radio frequency","Linearity","CMOS technology","Semiconductor device modeling","Distortion measurement","Energy consumption","Current measurement","Power measurement","Charge carrier processes","Harmonic analysis"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194815
  • Filename
    1503745
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619527