• DocumentCode
    3619529
  • Title

    Fluctuation Limits on Scaling of CMOS SRAMs

  • Author

    A. Bhavnagarwala;A. Kapoor;J. Meindl

  • Author_Institution
    Georgia Institute of Technology, Atlanta, GA, USA
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    472
  • Lastpage
    475
  • Keywords
    "Fluctuations","Random access memory","Threshold voltage","Semiconductor device modeling","MOSFET circuits","Transistors","Stochastic processes","Doping","Semiconductor device noise","Geometry"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194817
  • Filename
    1503747
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619529