DocumentCode :
3619531
Title :
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
Author :
S. Cova;C. Porta;F. Stellari;F. Zappa;J.C. Tsang
Author_Institution :
Politecnico di Milano, Italy
fYear :
2000
fDate :
6/22/1905 12:00:00 AM
Firstpage :
480
Lastpage :
483
Keywords :
"Circuit testing","Detectors","Ring oscillators","Inverters","Counting circuits","MOSFETs","Luminescence","Frequency synchronization","Time measurement","Hot carriers"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194819
Filename :
1503749
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619531
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