• DocumentCode
    3619531
  • Title

    Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors

  • Author

    S. Cova;C. Porta;F. Stellari;F. Zappa;J.C. Tsang

  • Author_Institution
    Politecnico di Milano, Italy
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    480
  • Lastpage
    483
  • Keywords
    "Circuit testing","Detectors","Ring oscillators","Inverters","Counting circuits","MOSFETs","Luminescence","Frequency synchronization","Time measurement","Hot carriers"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194819
  • Filename
    1503749
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619531