3619532

Determination of the Recombination Lifetime in the Space Charge Region of MOS Field-Induced PN Junctions

R. Sorge;B. Heinemann;J. Grabmeier;G. Obermeier;H. Richter

IHP, Frankfurt (Oder), Germany

2000

6/22/1905 12:00:00 AM

484

487

"Space charge","Pollution measurement","Current measurement","Capacitance measurement","Frequency measurement","Current-voltage characteristics","Voltage","Contamination","Energy states","Energy measurement"

ieee

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

2-86332-248-6

conf

10.1109/ESSDERC.2000.194820

1503750