3619534

A Novel Test Structure for Sub-micron CMOS Leakage Characterisation and Modelling

Zhenqiu Ning;S. Hoste;W. Vanderbauwhede;R. Gillon;M. Tack;P. Raes

Alcatel Microelectronics, Oudenaarde, Belgium

2000

6/22/1905 12:00:00 AM

492

495

"Testing","Semiconductor device modeling","Leakage current","Circuits","MOS devices","Diodes","Power dissipation","Threshold voltage","Variable structure systems","Inverters"

ieee

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

2-86332-248-6

conf

10.1109/ESSDERC.2000.194822

1503752