• DocumentCode
    3619534
  • Title

    A Novel Test Structure for Sub-micron CMOS Leakage Characterisation and Modelling

  • Author

    Zhenqiu Ning;S. Hoste;W. Vanderbauwhede;R. Gillon;M. Tack;P. Raes

  • Author_Institution
    Alcatel Microelectronics, Oudenaarde, Belgium
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    492
  • Lastpage
    495
  • Keywords
    "Testing","Semiconductor device modeling","Leakage current","Circuits","MOS devices","Diodes","Power dissipation","Threshold voltage","Variable structure systems","Inverters"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194822
  • Filename
    1503752
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619534