• DocumentCode
    3619535
  • Title

    Measurements and 3D Simulations of Full-Chip Potential Distribution at Parasitic Substrate Current Injection

  • Author

    M. Schenkel;P. Pfaffli;S. Mettler;W. Reiner;W.D. Aemmer

  • Author_Institution
    ETH Zurich, Switzerland
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    600
  • Lastpage
    603
  • Keywords
    Current measurement
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194849
  • Filename
    1503779
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619535