Title :
Measurements and 3D Simulations of Full-Chip Potential Distribution at Parasitic Substrate Current Injection
Author :
M. Schenkel;P. Pfaffli;S. Mettler;W. Reiner;W.D. Aemmer
Author_Institution :
ETH Zurich, Switzerland
fDate :
6/22/1905 12:00:00 AM
Keywords :
Current measurement
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194849
