• DocumentCode
    3619539
  • Title

    Statistical Hot-Carrier Reliability Simulation using a Novel SPICE Parameter Evolution Model

  • Author

    S. Minehane;K.G. McCarthy;P. O´Sullivan;A. Mathewson

  • Author_Institution
    National Microelectronics Research Centre, Cork, Ireland
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    616
  • Lastpage
    619
  • Keywords
    "Hot carriers","SPICE","Degradation","Circuit simulation","Parameter extraction","Stress measurement","Data mining","Context modeling","Predictive models","MOSFET circuits"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194853
  • Filename
    1503783
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619539