DocumentCode :
3619539
Title :
Statistical Hot-Carrier Reliability Simulation using a Novel SPICE Parameter Evolution Model
Author :
S. Minehane;K.G. McCarthy;P. O´Sullivan;A. Mathewson
Author_Institution :
National Microelectronics Research Centre, Cork, Ireland
fYear :
2000
fDate :
6/22/1905 12:00:00 AM
Firstpage :
616
Lastpage :
619
Keywords :
"Hot carriers","SPICE","Degradation","Circuit simulation","Parameter extraction","Stress measurement","Data mining","Context modeling","Predictive models","MOSFET circuits"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194853
Filename :
1503783
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619539
