DocumentCode :
3619547
Title :
Study of Hot-spot Phenomena in Cellular Power Transistors by Analytical Electro-Thermal Simulation
Author :
P.E. Bagnoli;S. Di Pascoli;G. Breglio
Author_Institution :
University of Pisa, Italy
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
547
Lastpage :
550
Keywords :
"Power transistors","Analytical models","Thermal resistance","Thermal conductivity","Steady-state","Power engineering and energy","Information analysis","Temperature distribution","Computational modeling","Packaging"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.194989
Filename :
1503919
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619547
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