• DocumentCode
    3619561
  • Title

    Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability

  • Author

    N.K. Jha; V. Ramgopal Rao;J.C.S. Woo

  • Author_Institution
    Indian Institute of Technology, Mumbai, India
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    603
  • Lastpage
    606
  • Keywords
    "MOSFET circuits","Implants","Degradation","Current measurement","Hot carriers","Transconductance","CMOS technology","Analog circuits","Stress measurement","Voltage"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.195003
  • Filename
    1503933
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619561