3619561

Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability

N.K. Jha; V. Ramgopal Rao;J.C.S. Woo

Indian Institute of Technology, Mumbai, India

2002

6/24/1905 12:00:00 AM

603

606

"MOSFET circuits","Implants","Degradation","Current measurement","Hot carriers","Transconductance","CMOS technology","Analog circuits","Stress measurement","Voltage"

ieee

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

88-900847-8-2

conf

10.1109/ESSDERC.2002.195003

1503933