DocumentCode :
3619565
Title :
Microwave noise Modeling of the 0.18um Gate Length Mosfets with a 60GHz Cut-off Frequency
Author :
P. Sakalas;A. Litwin;H. Zirath;M. Schroter
Author_Institution :
Dresden University of Technology, Germany
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
619
Lastpage :
622
Keywords :
"MOSFETs","Cutoff frequency","Semiconductor device noise","Radio frequency","Circuit noise","Fingers","Equivalent circuits","Substrates","Noise measurement","Testing"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
Type :
conf
DOI :
10.1109/ESSDERC.2002.195007
Filename :
1503937
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619565
