Evaluation of MOSFET Reliability in Analog Applications

Author

R. Thewes;R. Brederlow;C. Schlunder;P. Wieczorek;B. Ankele;A. Hesener;J. Holz;S. Kessel;W. Weber

Author_Institution

Infineon Technologies AG, Munich, Germany

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

Lastpage

Keywords

MOSFET circuits

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

Print_ISBN

2-914601-01-8

Type

DOI

10.1109/ESSDERC.2001.195207

Filename

1506589

Link To Document