• DocumentCode
    3619648
  • Title

    RF-Noise of Deep-Submicron MOSFETs: Extraction and Modeling

  • Author

    G. Knoblinger

  • Author_Institution
    Infineon Technologies, Munich, Germany
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    331
  • Lastpage
    334
  • Keywords
    "MOSFETs","Noise measurement","CMOS technology","Hot carrier effects","Radio frequency","Thermal resistance","Noise figure","Wireless communication","System-on-a-chip","Low-noise amplifiers"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2001. Proceeding of the 31st European
  • Print_ISBN
    2-914601-01-8
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2001.195268
  • Filename
    1506650
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619648