• DocumentCode
    3619655
  • Title

    Relationship of conduction and noise parameters in Low Temperature Poly-Si TFTs

  • Author

    A. Mercha;L. Pichon;R. Carin;O. Bonnaud

  • Author_Institution
    GREYC-Instrumentation, France
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    359
  • Lastpage
    362
  • Keywords
    "Temperature","Thin film transistors","Crystallization","Low-frequency noise","Electrical resistance measurement","Switches","Grain size","Noise measurement","Electric resistance","Subthreshold current"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2001. Proceeding of the 31st European
  • Print_ISBN
    2-914601-01-8
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2001.195275
  • Filename
    1506657
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619655