3619655

Relationship of conduction and noise parameters in Low Temperature Poly-Si TFTs

A. Mercha;L. Pichon;R. Carin;O. Bonnaud

GREYC-Instrumentation, France

2001

6/23/1905 12:00:00 AM

359

362

"Temperature","Thin film transistors","Crystallization","Low-frequency noise","Electrical resistance measurement","Switches","Grain size","Noise measurement","Electric resistance","Subthreshold current"

ieee

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

2-914601-01-8

conf

10.1109/ESSDERC.2001.195275

1506657