DocumentCode

3620005

Title

IEEE computer society

fYear

2005

fDate

6/27/1905 12:00:00 AM

Firstpage

79

Lastpage

81

Publisher

ieee

Conference_Titel

Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on

Print_ISBN

1-4244-0034-1

Type

conf

DOI

10.1109/DBT.2005.1531309

Filename

1531309