DocumentCode :
3620005
Title :
IEEE computer society
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
79
Lastpage :
81
Publisher :
ieee
Conference_Titel :
Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
Print_ISBN :
1-4244-0034-1
Type :
conf
DOI :
10.1109/DBT.2005.1531309
Filename :
1531309
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3620005
