مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3620467

Title :

Open Call for Benchmark/Test Dataset

fYear :

2005

fDate :

6/27/1905 12:00:00 AM

Keywords :

"Benchmark testing","Videos","Conferences","Computer vision","Image coding","Transform coding","Image sensors","Sensor phenomena and characterization","Thermal sensors","Laboratories"

Publisher :

ieee

Conference_Titel :

Computer Vision and Pattern Recognition - Workshops, 2005. CVPR Workshops. IEEE Computer Society Conference on

ISSN :

1063-6919

Print_ISBN :

0-7695-2372-2

Type :

conf

DOI :

10.1109/CVPR.2005.505

Filename :

1565291

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3620467