مرکز منطقه ای اطلاع رساني علوم و فناوري - Will continued process-node shrinks kill high-performance analog design?

DocumentCode :

3620626

Title :

Will continued process-node shrinks kill high-performance analog design?

Author :

J. Savoj;D. RIch;B. Forejt;P. Kinget; Un-Ku Moon;M. Oprysko;B. Razavi;H. Shichijo;A. Wang

fYear :

2005

fDate :

6/27/1905 12:00:00 AM

Firstpage :

616

Lastpage :

617

Keywords :

"Instruments","Moon","Circuits","Sampling methods","Phase locked loops","Voltage fluctuations","Clocks"

Publisher :

ieee

Conference_Titel :

Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005

Print_ISBN :

0-7803-9023-7

Type :

conf

DOI :

10.1109/CICC.2005.1568744

Filename :

1568744

Link To Document :