DocumentCode :
3621496
Title :
Further Generalization of the Low-Frequency True-RMS instrument
Author :
V. Pjevalica;V. Vujicic
Author_Institution :
NIS-GAS, Maintenance Service, Technical Provision Section, Narodnog fronta 12, 21000 Novi Sad, Serbia and Montenegro. E-mail: veljus@nis-gas.com
Volume :
2
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
1008
Lastpage :
1011
Abstract :
In this paper, it is shown that the use of random uniform dither in harmonics measurement can significantly shorten the word of applied A/D converter and shorten the word of applied base function (sine and/or cosine), stored in memory, without accuracy loosing. This fact enables design of simple instrument for harmonics measurement. It is proven theoretically, by simulation and by experiment that 6-bit dithered A/D converter word, 8-bit dithered base function word, and 6times8 (14-bits) multiplier word assure measurement of 16 harmonics (16 sine and 16 cosine components) with 13-bit accuracy. Putting n such simple devices in parallel it is possible to measure n times 16 harmonics simultaneously. The measurement of 1 times 16 harmonics is realized in the small PLD chip
Keywords :
"Instruments","Semiconductor device measurement","Stochastic processes","Power measurement","Measurement uncertainty","Time measurement","Frequency measurement","Polynomials","Measurement errors","Artificial neural networks"
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-8879-8
Type :
conf
DOI :
10.1109/IMTC.2005.1604291
Filename :
1604291
Link To Document :
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