Title :
SET: interactive tool for learning and training scan-based DFT principles and their consequences to parameters of embedded system
Author :
J. Strnadel;Z. Kotasek
Author_Institution :
Fac. of Inf. Technol., Brno Univ. of Technol., Czech Republic
fDate :
6/28/1905 12:00:00 AM
Abstract :
In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system
Keywords :
"Embedded system","Conferences","Embedded computing"
Conference_Titel :
Engineering of Computer Based Systems, 2006. ECBS 2006. 13th Annual IEEE International Symposium and Workshop on
Print_ISBN :
0-7695-2546-6
DOI :
10.1109/ECBS.2006.65
