• DocumentCode
    3621513
  • Title

    SET: interactive tool for learning and training scan-based DFT principles and their consequences to parameters of embedded system

  • Author

    J. Strnadel;Z. Kotasek

  • Author_Institution
    Fac. of Inf. Technol., Brno Univ. of Technol., Czech Republic
  • fYear
    2006
  • fDate
    6/28/1905 12:00:00 AM
  • Lastpage
    498
  • Abstract
    In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system
  • Keywords
    "Embedded system","Conferences","Embedded computing"
  • Publisher
    ieee
  • Conference_Titel
    Engineering of Computer Based Systems, 2006. ECBS 2006. 13th Annual IEEE International Symposium and Workshop on
  • Print_ISBN
    0-7695-2546-6
  • Type

    conf

  • DOI
    10.1109/ECBS.2006.65
  • Filename
    1607409
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3621513