DocumentCode :
3621537
Title :
CMOS devices high performance CMOS
Author :
D. Burnett;T. Ohguro
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
216
Lastpage :
216
Keywords :
"Tensile stress","Paper technology","Silicon germanium","Germanium silicon alloys","Compressive stress","MOS devices","Displays","Delay","Radio frequency","CMOS technology"
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
Print_ISBN :
0-7803-9268-X
Type :
conf
DOI :
10.1109/IEDM.2005.1609310
Filename :
1609310
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3621537