• DocumentCode
    3621953
  • Title

    BIST Structure for ASIC Circuits

  • Author

    I. Gosciniak

  • Author_Institution
    University of Silesia in Katowice, Poland
  • Volume
    1
  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    840
  • Lastpage
    845
  • Abstract
    The paper presents the possibility to use linear modification to build the testing structure for the ASIC SC and GA mask programmable circuits. The proposed conception was verified by simulating research of proposed testing structure using ISCAS´89 benchmark circuits. The conclusions included in the paper were illustrated by simulating research results of single and multimodular circuits. The proposed method of linear modification is characterised by small circuit overhead and high effectiveness of testing
  • Keywords
    "Built-in self-test","Application specific integrated circuits","Circuit testing","Automatic testing","Buildings","Registers","Genetic algorithms","Logic testing","Benchmark testing","Feedback"
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence for Modelling, Control and Automation, 2005 and International Conference on Intelligent Agents, Web Technologies and Internet Commerce, International Conference on
  • Print_ISBN
    0-7695-2504-0
  • Type

    conf

  • DOI
    10.1109/CIMCA.2005.1631369
  • Filename
    1631369
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3621953