A High-Frequency Extension of a Surface-PotentialBased Substrate Model for Noise Coupling Analysis

In this paper we present a high-frequency extension of our surface-potential-based substrate model for predicting substrate noise coupling in integrated circuits. The model handles an arbitrary number of aggressor and victim devices on a multi-layered substrate with either biased or floating backside. We show that the dielectric properties of the substrate are easily included in this model for providing a more accurate description above GHz frequencies. Finite element calculations are used for validating the model