DocumentCode :
3622159
Title :
Influence of Simultaneous Mechanical and Electrical Straining on Conventional Thick-Film Resistors
Author :
Z. Stanimirovic;M.M. Jevtic;I. Stanimirovic
Author_Institution :
IRITEL A.D., Belgrade
fYear :
2006
fDate :
6/28/1905 12:00:00 AM
Firstpage :
587
Lastpage :
590
Abstract :
In this paper the results from a study of simultaneous mechanical and electrical straining effects on performances of conventional thick-film resistors based on resistor composition with sheet resistance of 1kOmega/sq are presented. For experimental purposes a series of thick-film test resistors with different geometries were realized and subjected to simultaneous electrical and mechanical straining using 1.2/50mus pulses in combination with mechanical substrate deflection of 300mum. Obtained experimental results were analyzed and correlation between resistance, noise index and gauge factor changes with resistor degradation due to simultaneous impact of these two types of straining were observed
Keywords :
"Resistors","Performance evaluation","Electrical resistance measurement","Electric resistance","Mechanical variables measurement","Electric variables measurement","Thickness measurement","Materials testing","Force measurement","Geometry"
Publisher :
ieee
Conference_Titel :
Microelectronics, 2006 25th International Conference on
Print_ISBN :
1-4244-0117-8
Type :
conf
DOI :
10.1109/ICMEL.2006.1651035
Filename :
1651035
Link To Document :
بازگشت