Title :
Laboratory ADC Tester Based on NI-6251 Acquisition Card
Author :
M. Nikolic;M. Sokolovic;P. Petkovic
Author_Institution :
Fac. of Electron. Eng., Nis Univ.
fDate :
6/28/1905 12:00:00 AM
Abstract :
Analog to digital converter (ADC) is the crucial part of many mixed-signal ICs because it interfaces analog signals from real world with digital logic on a chip. Faults made during ADC hardly can be repaired within the digital part. Therefore, functional testing of ADC is a very important task especially during prototyping. In this paper one laboratory ADC tester is proposed. It is based on NI-6251 data acquisition card and a PC that controls the testing process using Lab View software
Keywords :
"Laboratories","Circuit testing","Prototypes","Integrated circuit testing","Analog-digital conversion","Circuit faults","Data acquisition","Design for testability","Signal processing","Digital signal processing"
Conference_Titel :
Microelectronics, 2006 25th International Conference on
Print_ISBN :
1-4244-0117-8
DOI :
10.1109/ICMEL.2006.1651054
