Title :
Dependable Design for FPGA Based on Duplex System and Reconfiguration
Author :
P. Kubalik;R. Dobias;H. Kubatova
Author_Institution :
Czech Technical University in Prague, Czech Republic
fDate :
6/28/1905 12:00:00 AM
Abstract :
A technique for highly reliable digital design in FPGAs is presented. Two FPGAs are used for duplex system design, but better dependability parameters are obtained by combination of totally self checking blocks based on parity predictor. Each FPGA can be reconfigured when a SEU fault is detected. Combinational circuit benchmarks have been considered in all our experiments and computations. All our experimental results are obtained by XILINX FPGA implementation by EDA tools. The dependability model and dependability calculations are presented
Keywords :
"Field programmable gate arrays","Circuit faults","Single event upset","Electrical fault detection","Random access memory","Testing","Availability","Combinational circuits","Electronic design automation and methodology","Mission critical systems"
Conference_Titel :
Digital System Design: Architectures, Methods and Tools, 2006. DSD 2006. 9th EUROMICRO Conference on
Print_ISBN :
0-7695-2609-8
DOI :
10.1109/DSD.2006.38