• DocumentCode
    3622596
  • Title

    Effects of charge-based computation non-idealities on CMOS image compression sensors

  • Author

    Zhiqiang Lin;M.W. Hoffman;W.D. Leon;N. Schemm;S. Balkir

  • Author_Institution
    Dept. of Electr. Eng., Nebraska-Lincoln Univ., Lincoln, NE, USA
  • fYear
    2006
  • fDate
    6/28/1905 12:00:00 AM
  • Abstract
    We present a CMOS image sensor that performs focal plane image decomposition based on charge sharing computation circuitry. The effect of parasitic capacitance between capacitor bottom plate and substrate on the computational accuracy is discussed and a new circuit is also proposed to characterize the parasitic effects. The test results demonstrate that prediction based focal plane image compression can be realized inside the sensor array resulting in high compression performance using frame rate pixel parallel computation. This architecture can subsequently be combined with backend level testing encoding to form a complete compression sensor
  • Keywords
    "CMOS image sensors","Image coding","Charge-coupled image sensors","Sensor phenomena and characterization","Sensor arrays","Circuit testing","Image decomposition","Parasitic capacitance","Capacitors","Image sensors"
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
  • Print_ISBN
    0-7803-9389-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2006.1693801
  • Filename
    1693801