Title :
Analysis of EOS electric field modeling precision
Author :
A. Noreika;P. Tarvydas;D. Navikas;V. Cepulis
Author_Institution :
Dept. of Electron. Eng., Kaunas Univ. of Technol.
fDate :
6/28/1905 12:00:00 AM
Abstract :
Principles of electronic optical system (EOS) modeling using finite element method are presented. Modeling precision dependence on finite element mesh density is investigated. Modeling precision of electric field potential created by EOS is analyzed by calculating electron trajectories and scattering of their traces on the screen
Keywords :
"Earth Observing System","Finite element methods","Electrodes","Electrons","Electric potential","Optical scattering","Cathode ray tubes","Charge carrier processes","Engine cylinders","Mesh generation"
Conference_Titel :
Information Technology Interfaces, 2006. 28th International Conference on
Print_ISBN :
953-7138-05-4
DOI :
10.1109/ITI.2006.1708542
