• DocumentCode
    3622714
  • Title

    Analysis of EOS electric field modeling precision

  • Author

    A. Noreika;P. Tarvydas;D. Navikas;V. Cepulis

  • Author_Institution
    Dept. of Electron. Eng., Kaunas Univ. of Technol.
  • fYear
    2006
  • fDate
    6/28/1905 12:00:00 AM
  • Firstpage
    563
  • Lastpage
    568
  • Abstract
    Principles of electronic optical system (EOS) modeling using finite element method are presented. Modeling precision dependence on finite element mesh density is investigated. Modeling precision of electric field potential created by EOS is analyzed by calculating electron trajectories and scattering of their traces on the screen
  • Keywords
    "Earth Observing System","Finite element methods","Electrodes","Electrons","Electric potential","Optical scattering","Cathode ray tubes","Charge carrier processes","Engine cylinders","Mesh generation"
  • Publisher
    ieee
  • Conference_Titel
    Information Technology Interfaces, 2006. 28th International Conference on
  • ISSN
    1330-1012
  • Print_ISBN
    953-7138-05-4
  • Type

    conf

  • DOI
    10.1109/ITI.2006.1708542
  • Filename
    1708542
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3622714