MIL-HDBK-217-A favorite target

The authors compare and contrast the physics of failure (POF) approach with the traditional MIL-HDBK-217 approach. It is concluded that a POF approach is not appropriate for use on many system development efforts because of cost and complexity; and it is clearly not applicable to devices already in production. The two approaches are attacking different problems (i.e. basic component design versus latent defects), and each should be used where appropriate: MIL-HDBK-217 should be used to perform early tradeoffs of competing designs during the system design process. The POF approach should be used for detailed device design prior to device life testing, to isolate the root cause of known problem areas and to provide guidance for corrective action. Component stresses should be controlled to reduce the occurrence of latent defects of fielded systems. MIL-HDBK-217 provides a proven methodical means of accomplishing this last recommendation.