Title :
Hybrid design of parallel signature analyzers
Author_Institution :
Tech. Univ. of Gliwice, Poland
fDate :
6/11/1905 12:00:00 AM
Abstract :
Parallel signature analyzers implemented as multiple-input linear-feedback shift registers (MISRs) are very useful for compressing test response data. The author presents a top-bottom exclusive (TBE) MISR which uses only (t+1)/2 XOR gates, in its linear feedback instead of t XOR gates used in other types of MISRs. An algebraic analysis of the operation and certain analytical results regarding the detection capability of a TBE-type MISR are included.
Keywords :
"Polynomials","Built-in self-test","Circuit testing","State feedback","Galois fields","Linear feedback shift registers","Shift registers","Very large scale integration","Test pattern generators"
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36263
