DocumentCode :
3623564
Title :
New model parameter extraction environment for the submicron circuit models
Author :
C.-H. Choi;J.-K. Park;Y.-G. Kim;K.-H. Kim;S.-H. Lee
Author_Institution :
Samsung Electronics, South Korea
fYear :
1993
Firstpage :
1535
Abstract :
A model parameter extraction system, called APEX (advanced model parameter extractor), is described. APEX provides the knowledge-assistant algorithm, which leads an optimizer to find optimal parameters automatically, and it also provides useful environments to obtain DC and AC parameters which guarantee good agreement with C-V data and the inverter chain delay, as well as I-V data. The experimental results using APEX show that optimal DC and AC parameter sets, including temperature parameters at different temperatures, can be easily and accurately obtained for the various sizes of transistors within a reasonable time.
Keywords :
"Parameter extraction","Circuits","MOSFETs","Data mining","Capacitance-voltage characteristics","Equations","Algorithm design and analysis","Inverters","Temperature","Curve fitting"
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS ´93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
Type :
conf
DOI :
10.1109/ISCAS.1993.394028
Filename :
394028
Link To Document :
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