DocumentCode :
3623753
Title :
Simulation of Reduction Properties of Radiated Emission by On-chip Decoupling Capacitor
Author :
Toshio Sudo;Manabu Bonkohara
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
15
Lastpage :
18
Keywords :
"Capacitors","Finite difference methods","Circuit simulation","Packaging","Time domain analysis","Frequency","Large scale integration","Inductance","Circuit noise","Degradation"
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings
Print_ISBN :
0-7803-9821-1
Type :
conf
DOI :
10.1109/SPI.2002.258278
Filename :
4027643
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3623753
