• DocumentCode
    3623768
  • Title

    Charge-based on-chip measurement technique for the selective extraction of cross-coupling capacitances

  • Author

    Alessandro Bogliolo;Loris Vendrame;Luca Bortesi;Ezio Barachetti

  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    75
  • Lastpage
    77
  • Keywords
    "Measurement techniques","Capacitance measurement","Semiconductor device measurement","Integrated circuit measurements","Current measurement","Parasitic capacitance","Testing","Transducers","MOSFETs","Integrated circuit interconnections"
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings
  • Print_ISBN
    0-7803-9821-1
  • Type

    conf

  • DOI
    10.1109/SPI.2002.258287
  • Filename
    4027661
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3623768