3623777

LFSR Test Pattern Crosstalk in Nanometer Technologies

Dieter Treytnar;Michael Redeker;Hartmut Grabinski;F.M. Ktata

2002

6/24/1905 12:00:00 AM

115

118

"Crosstalk","Integrated circuit technology","Circuit testing","Geometry","Integrated circuit interconnections","Frequency","Inductance","Capacitance","Integrated circuit testing","Transmission lines"

ieee

Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings

0-7803-9821-1

conf

10.1109/SPI.2002.258315

4027673