• DocumentCode
    3623984
  • Title

    Changing Test Industry: The Analysts´ Perspective

  • Author

    Amy Gold;Rochit Rajsuman

  • Author_Institution
    Advantest America
  • fYear
    2006
  • Firstpage
    1
  • Lastpage
    1
  • Keywords
    "Semiconductor device testing","Gold","Costs","Corporate acquisitions","Electronics industry","Data compression","Built-in self-test","Design for manufacture","Very large scale integration","Security"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC ´06. IEEE International
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0291-3
  • Electronic_ISBN
    2378-2250
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297749
  • Filename
    4079427
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3623984