3623984

Changing Test Industry: The Analysts´ Perspective

Amy Gold;Rochit Rajsuman

Advantest America

2006

1

1

"Semiconductor device testing","Gold","Costs","Corporate acquisitions","Electronics industry","Data compression","Built-in self-test","Design for manufacture","Very large scale integration","Security"

ieee

Test Conference, 2006. ITC ´06. IEEE International

1089-3539

1-4244-0291-3

2378-2250

conf

10.1109/TEST.2006.297749

4079427