DocumentCode :
3624065
Title :
New Challenges and Requirements to Reliability Research and Development in Semiconductor Technology Evolution
Author :
Yi Ma
Author_Institution :
Applied Materials
fYear :
2006
Firstpage :
215
Lastpage :
215
Keywords :
"Semiconductor device reliability","Research and development","Image sensors","Image storage","Materials reliability","Semiconductor materials","Costs"
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2006 IEEE International
ISSN :
1930-8841
Print_ISBN :
1-4244-0296-4
Electronic_ISBN :
2374-8036
Type :
conf
DOI :
10.1109/IRWS.2006.305251
Filename :
4098728
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3624065
