DocumentCode :
3624067
Title :
Strategy of Future Reliability Qualification
Author :
Andreas Preussger
Author_Institution :
Infineon Technologies
fYear :
2006
Firstpage :
216
Lastpage :
217
Keywords :
"Qualifications","Testing","Phase change random access memory","Degradation","Abstracts","Phase change memory","Phase change materials","Manufacturing"
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2006 IEEE International
ISSN :
1930-8841
Print_ISBN :
1-4244-0296-4
Electronic_ISBN :
2374-8036
Type :
conf
DOI :
10.1109/IRWS.2006.305253
Filename :
4098730
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3624067
