Title :
Analysis of the Residual Spectrum in ADC Dynamic Testing
Author_Institution :
Faculty of Electrical Engineering, University of Ljubljana, Trzaska 25, 1001 Ljubljana, Slovenia. Phone: +386 1 4768 220, Fax: +386 1 4768 426, E-mail: dusan.agrez@fe.uni-lj.si
fDate :
4/1/2006 12:00:00 AM
Abstract :
This paper presents a procedure that derives the estimation of the significant components in the residual spectrum in ADC dynamic testing. The method for emulating coherent sampling by the interpolation of the DFT to estimate the frequency, amplitude, and phase of the particular residual component is described. Analysis has been made for the components below the level of the quantization resolution. The procedure of the threshold estimation for distinguishing between significant components and the noise floor is provided
Keywords :
"Testing","Circuit noise","Frequency estimation","Sampling methods","Additive white noise","Parameter estimation","Discrete Fourier transforms","Interpolation","Quantization","Noise reduction"
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Print_ISBN :
0-7803-9359-7
DOI :
10.1109/IMTC.2006.328339
