DocumentCode
3624295
Title
Analysis of the Residual Spectrum in ADC Dynamic Testing
Author
Dusan Agrez
Author_Institution
Faculty of Electrical Engineering, University of Ljubljana, Trzaska 25, 1001 Ljubljana, Slovenia. Phone: +386 1 4768 220, Fax: +386 1 4768 426, E-mail: dusan.agrez@fe.uni-lj.si
fYear
2006
fDate
4/1/2006 12:00:00 AM
Firstpage
1033
Lastpage
1037
Abstract
This paper presents a procedure that derives the estimation of the significant components in the residual spectrum in ADC dynamic testing. The method for emulating coherent sampling by the interpolation of the DFT to estimate the frequency, amplitude, and phase of the particular residual component is described. Analysis has been made for the components below the level of the quantization resolution. The procedure of the threshold estimation for distinguishing between significant components and the noise floor is provided
Keywords
"Testing","Circuit noise","Frequency estimation","Sampling methods","Additive white noise","Parameter estimation","Discrete Fourier transforms","Interpolation","Quantization","Noise reduction"
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
ISSN
1091-5281
Print_ISBN
0-7803-9359-7
Type
conf
DOI
10.1109/IMTC.2006.328339
Filename
4124493
Link To Document