• DocumentCode
    3624485
  • Title

    Formation of sharp-apex pyramids for active tips used in scanning probe microscopy

  • Author

    J. Soltys;D. Gregusova;R. Kudela;A. Satka;I. Kostic;V. Cambel

  • Author_Institution
    Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovakia. e-mail: jan.soltys@savba.sk
  • fYear
    2006
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    This work is a part of a deeper study into technologies developed for the so-called active tips for use in scanning probe microscopy. This paper show that using an AlAs facet-forming sacrificial layer and a H 3PO4, H2O2, H2O based solution, symmetric pyramidal structures with tip diameter below 35 nm can be prepared. Such pyramidal objects was used for further MOCVD overgrowth. Finally, the quality of the mesa sidewalls obtained was controlled using the SEM and AFM. The pyramids are suitable for the next processing, and various semiconductor devices can be prepared on the pyramid
  • Keywords
    "Scanning probe microscopy","Atomic force microscopy","Scanning electron microscopy","Magnetic force microscopy","Gallium arsenide","Thermal force","Mechanical variables measurement","MOCVD","Semiconductor materials","Spatial resolution"
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices and Microsystems, 2006. ASDAM ´06. International Conference on
  • Print_ISBN
    1-4244-0369-0
  • Type

    conf

  • DOI
    10.1109/ASDAM.2006.331165
  • Filename
    4133089