Title :
An Improved Method for Simultaneous Small-Signal and Noise Characterization of Two-Ports Using Multi-State Radiometer
Author :
Marek Schmidt-Szalowski;Wojciech Wiatr
Author_Institution :
Institute of Electronic Systems, Warsaw University of Technology, Nowowiejska 15/19,00-665 Warsaw, Poland. Phone: (48 22)6607877, Fax: (48 22)8252300, eMail: mschmidt@elka.pw.edu.pl
Abstract :
A new noise method for accurate small-signal and noise parameter characterization of two-ports using multi-state radiometer is presented. It is based on a novel mathematical model describing thoroughly all mismatches and a noise contribution of the measurement system. Using the method, the two-port´s scattering and noise parameters are determined simultaneously from at least 12 noise power readouts made in different measurement states. The method has been validated experimentally for a low-noise MESFET as an example.
Keywords :
"Noise measurement","Semiconductor device noise","Scattering parameters","Microwave radiometry","Power measurement","Instruments","Noise figure","Time measurement","Temperature","Mathematical model"
Conference_Titel :
Microwave Conference, 1999. 29th European
DOI :
10.1109/EUMA.1999.338409
