DocumentCode :
3624822
Title :
Highly sensitive silicon detectors of thermal neutrons
Author :
Josef Uher;Christer Frojdh;Jan Jakubek;Chris Kenney;Zdenek Kohout;Vladimir Linhart;Sherwood Parker;Sture Petersson;Stanislav Pospisil;Goran Thungstrom
Author_Institution :
Institute of Experimental and Applied Physics, Czech Technical University, Prague, Horska 3a/22, CZ-12800 Prague 2, Czech Republic, telephone: +420 224 359 395, fax: +420 224 359 392, e-mail: josef.uher@utef.cvut.cz
Volume :
3
fYear :
2006
Firstpage :
1346
Lastpage :
1348
Abstract :
Planar semiconductor diodes supplemented with a layer of an appropriate neutron converter such as 6LiF can be used for thermal neutron counting or imaging. Neutrons interacting in the converter generate alphas and tritons which enter the semiconductor and are detected there. However, simple planar devices suffer from limited detection efficiency which cannot reach more than about 5%. The limit in detection efficiency can be overcome by etching a 3D microstructure of trenches, pores or columns in the detector and filling it with the neutron converter. The overall neutron detection efficiency of such structure with pores was simulated. The results indicate an increase in the detection efficiency by factor of 6 in comparison with a standard planar neutron detector. Samples with different silicon column sizes were fabricated to study the electrical properties of 3D structures. The charge collection efficiency in silicon columns from 10 mum to 800 mum wide and 80 mum high was measured. Single pad detectors with pores were also fabricated and tested for thermal neutron detection. The samples have square pores of 20 mum wide, ~60 mum deep. The pore pitch is 70 mum. 6LiF was used as the neutron converter in all cases. Pulse height spectra of the filled samples irradiated by thermal neutrons were measured. The measurement proved functionality of such detectors and its usability for thermal neutron detection.
Keywords :
"Silicon","Detectors","Neutrons","Pulse measurements","Semiconductor diodes","Etching","Microstructure","Filling","Current measurement","Charge measurement"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
ISSN :
1082-3654
Print_ISBN :
1-4244-0560-2
Type :
conf
DOI :
10.1109/NSSMIC.2006.354152
Filename :
4179265
Link To Document :
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