• DocumentCode
    3625897
  • Title

    Synthetic TEC Mapping with Kriging and Random Field Priors

  • Author

    Isiltan Sayin;Feza Arikan;Orhan Arikan

  • Author_Institution
    Hacettepe ?niversitesi, Elektrik ve Elektronik M?hendisli?i B?l?m?, Ankara. isiltan@ee.hacettepe.edu.tr
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Total electron content (TEC) can be used for analyzing the variability of the ionosphere in space and time. In this study, spatial interpolation is implemented by Kriging and random field priors (RFP), which are widely used in geostatistics. Performance of Kriging and RFP methods are analyzed on synthetic TEC data for different trend functions, sampling patterns, sampling numbers, variance and range values of covariance function which is used to simulate the synthetic data, by comparing the normalized errors of interpolations. In regular sampling patterns, as opposed to random sampling, the normalized average error is very close to each other for all methods and trend assumptions. The error increases with variance and decreases with range. As the number of samples increase, the normalized error also decreases.
  • Keywords
    "Tellurium","Sampling methods","Interpolation","Spline","Global Positioning System","Gaussian processes","Electrons","Ionosphere","Analysis of variance","Pattern analysis"
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing and Communications Applications, 2007. SIU 2007. IEEE 15th
  • ISSN
    2165-0608
  • Print_ISBN
    1-4244-0719-2
  • Type

    conf

  • DOI
    10.1109/SIU.2007.4298671
  • Filename
    4298671