DocumentCode
3625897
Title
Synthetic TEC Mapping with Kriging and Random Field Priors
Author
Isiltan Sayin;Feza Arikan;Orhan Arikan
Author_Institution
Hacettepe ?niversitesi, Elektrik ve Elektronik M?hendisli?i B?l?m?, Ankara. isiltan@ee.hacettepe.edu.tr
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
1
Lastpage
4
Abstract
Total electron content (TEC) can be used for analyzing the variability of the ionosphere in space and time. In this study, spatial interpolation is implemented by Kriging and random field priors (RFP), which are widely used in geostatistics. Performance of Kriging and RFP methods are analyzed on synthetic TEC data for different trend functions, sampling patterns, sampling numbers, variance and range values of covariance function which is used to simulate the synthetic data, by comparing the normalized errors of interpolations. In regular sampling patterns, as opposed to random sampling, the normalized average error is very close to each other for all methods and trend assumptions. The error increases with variance and decreases with range. As the number of samples increase, the normalized error also decreases.
Keywords
"Tellurium","Sampling methods","Interpolation","Spline","Global Positioning System","Gaussian processes","Electrons","Ionosphere","Analysis of variance","Pattern analysis"
Publisher
ieee
Conference_Titel
Signal Processing and Communications Applications, 2007. SIU 2007. IEEE 15th
ISSN
2165-0608
Print_ISBN
1-4244-0719-2
Type
conf
DOI
10.1109/SIU.2007.4298671
Filename
4298671
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