Title :
Application of Integral Analysis Technique to Determine Signal- and Power Integrity of Advanced Packages
Author :
Nebojsa Nenadovic;Ekkehard Miersch;Martin Versleijen;Sidina Wane
Author_Institution :
NXP Semiconductors, Gerstweg 2, Building FD 3.037,6534 AE Nijmegen, The Netherlands. email: nebojsa.nenadovic@nxp.com
Abstract :
In this paper an application of an integral analysis technique is demonstrated for determining signal integrity (SI) and power integrity (PI) of complex and advanced package solutions. A representative system-in-package (SiP) product has been selected as a carrier for our study, which is focused on analysis methodology, tools and flow. In particular, possibility to easily support what-if simulations for SI and PI, including analysis with distributed on-chip decoupling capacitors is investigated and highlighted. Importance of balancing between accuracy, CPU time and ease-of-use is also underlined.
Keywords :
"Signal analysis","Semiconductor device packaging","Integrated circuit packaging","Integrated circuit modeling","Capacitors","Design engineering","Electronic design automation and methodology","Databases","Analytical models","Lead compounds"
Conference_Titel :
Electrical Performance of Electronic Packaging, 2007 IEEE
Print_ISBN :
978-1-4244-0883-2
Electronic_ISBN :
2165-4115
DOI :
10.1109/EPEP.2007.4387155