• DocumentCode
    3627080
  • Title

    Optimization of Testing Methods for Investigation of Joints Quality Based on Vapour Phase Lead-free Soldering

  • Author

    Juraj Durisin;Alena Pietrikova;L´ubomir Livovsky

  • Author_Institution
    Department of Technologies in Electronics, Technical University of Ko?ice, Park Komensk?ho 2, 043 89 Ko?ice, Slovak, Republic. E-mail: juraj.durisin@tuke.sk, phone: +421 55 602 3199, fax: +421 602 3195
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    258
  • Lastpage
    262
  • Abstract
    Benchmarking of solder joints quality is a result of evaluation of more parameters. Solder paste and reflowed solder parameters, solder paste printing process, reflow process, components and PCBs surface finishes are the most important of them. Benchmarking the all Surface Mount Technology process with optimal techniques and methods provides a baseline of information that is key to effective process troubleshooting, manufacturability improvements and defect reduction. The developed benchmark test board features a design (the board and stencil pattern) with features for measuring solder physical, electrical and mechanical properties. Effect of different boards and components finishes, as well as effect of thermal cycling (effect of ageing) on structure and subsequently on mechanical and physical properties includes the intent of the board design. Based on these needs a comprehensive test board has been developed, which integrates testing of all the mentioned properties into a single multipurpose board design.
  • Keywords
    "Optimization methods","Environmentally friendly manufacturing techniques","Lead","Soldering","Benchmark testing","Mechanical factors","Printing","Surface finishing","Surface-mount technology","Manufacturing processes"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 30th International Spring Seminar on
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4244-1217-4
  • Electronic_ISBN
    2161-2064
  • Type

    conf

  • DOI
    10.1109/ISSE.2007.4432859
  • Filename
    4432859