DocumentCode :
3627089
Title :
Advanced tunable protective structure against electrostatic discharge
Author :
Betak Petr;Novacek Kamil
Author_Institution :
Department of Microelectronics, FEEC, BUT, Brno, Czech republic. Email: petr.betak@phd.feec.vutbr.cz
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
493
Lastpage :
496
Abstract :
ESD (electrostatic discharge) protection structures act as a protection of integrated circuits against parasitic electrostatic discharge events. They are located on input or output (I/O) pads. The use of such structures provides better robustness against ESD but also a number of secondary parasitic effects which limit the circuit performance. These effects, for example, limit the bandwidth of processed signals, causes bigger noise or lower gain. Among often used structures belong structures known as SCR (silicon controlled rectifier). Structures like SCR have some disadvantages, therefore they can not be universally usable. This text is dealing with advanced SCR structure, which overcomes disadvantages of conventional SCR protection cell. Physical principle of this new structure allows required features tuning by geometrical adjustments only.
Keywords :
"Protection","Electrostatic discharge","Thyristors","Anodes","Cathodes","Breakdown voltage","Circuit optimization","Clamps","Microelectronics","Leakage current"
Publisher :
ieee
Conference_Titel :
Electronics Technology, 30th International Spring Seminar on
ISSN :
2161-2528
Print_ISBN :
978-1-4244-1217-4
Electronic_ISBN :
2161-2064
Type :
conf
DOI :
10.1109/ISSE.2007.4432906
Filename :
4432906
Link To Document :
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