DocumentCode :
3627179
Title :
Exploration of GaTe for gamma detection
Author :
Adam M. Conway;Catherine E. Reinhardt;Rebecca J. Nikolic;Art J. Nelson;Tzu F. Wang;Kuang J. Wu;Stephen A. Payne;Alket Mertiri;Gary Pabst;Ronald Roy;Krishna C. Mandal;Pijush Bhattacharya;Yunlong Cui;Michael Groza;Arnold Burger
Author_Institution :
Lawrence Livermore National Laboratory, 7000 East Ave, L-188, CA 94550 USA
Volume :
2
fYear :
2007
Firstpage :
1551
Lastpage :
1555
Abstract :
The layered III-VI semiconductor Gallium Telluride has potential for room temperature gamma ray spectroscopy applications due to its band gap of 1.67 eV, and average atomic number of 45 : 31 (Ga) and 52 (Te). The physical properties of GaTe are highly anisotropic due to covalent bonding within the layer and van der Waals bonding between layers. This work reports the results of surface and bulk processing, surface characterization, and electrical characterization of diodes formed on both the laminar and non-laminar GaTe surfaces. Alpha detection measurements were also performed.
Keywords :
"Gamma ray detection","Gamma ray detectors","Bonding","III-V semiconductor materials","Temperature","Spectroscopy","Photonic band gap","Atomic layer deposition","Gallium","Tellurium"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS ´07. IEEE
ISSN :
1082-3654
Print_ISBN :
978-1-4244-0922-8
Type :
conf
DOI :
10.1109/NSSMIC.2007.4437294
Filename :
4437294
Link To Document :
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