DocumentCode

3627189

Title

Does test have a greater role to play in the DFM process?

Author

Sandip Kundu

Author_Institution

Department of Electrical and Computer Engineering University of Massachusetts, Amherst 01002, USA

fYear

2007

Firstpage

1

Lastpage

1

Publisher

ieee

Conference_Titel

Test Conference, 2007. ITC 2007. IEEE International

ISSN

1089-3539

Print_ISBN

978-1-4244-1127-6

Electronic_ISBN

2378-2250

Type

conf

DOI

10.1109/TEST.2007.4437686

Filename

4437686