Title :
Does test have a greater role to play in the DFM process?
Author_Institution :
Department of Electrical and Computer Engineering University of Massachusetts, Amherst 01002, USA
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
2378-2250
DOI :
10.1109/TEST.2007.4437686
