Title :
MobiQual: QoS-aware Load Shedding in Mobile CQ Systems
Author :
Bugra Gedik;Kun-Lung Wu;Philip S. Yu;Ling Liu
Author_Institution :
Thomas J. Watson Research Center, IBM Research, 19 Skyline Dr, Hawthorne, NY 10532. bgedik@us.ibm.com
Abstract :
Freshness and accuracy are two key measures of quality of service (QoS) in location-based, mobile continual queries (CQs). However, it is often difficult to provide both fresh and accurate CQ results due to (a) limited resources in computing and communication and (b) fast-changing load conditions caused by continuous mobile node movement. Thus a key challenge for a mobile CQ system is: How do we achieve the highest possible quality of the query results, in both freshness and accuracy, with currently available resources under changing load conditions? In this paper, we formulate this problem as a load shedding one, and develop MobiQual - a QoS-aware framework for performing both update load shedding and query load shedding. The design of MobiQual highlights three important features. (1) Differentiated load shedding: Different amounts of query and update load shedding are applied to different groups of queries and mobile nodes, respectively. (2) Per-query QoS specifications: The overall freshness and accuracy of the query results are maximized with individualized QoS specifications. (3) Low-cost adaptation: MobiQual dynamically adapts, with a minimal overhead, to changing load conditions and available resources. We show that, through a careful combination of update and query load shedding, the MobiQual approach leads to much higher freshness and accuracy in the query results in all cases, compared to existing approaches.
Keywords :
"Quality of service","Position measurement","Error correction","Mobile communication","Mobile computing","Resource management","Monitoring","Frequency","Educational institutions","Wireless sensor networks"
Conference_Titel :
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
Print_ISBN :
978-1-4244-1836-7
Electronic_ISBN :
2375-026X
DOI :
10.1109/ICDE.2008.4497521