DocumentCode

3627739

Title

Awards

fYear

2008

fDate

3/1/2008 12:00:00 AM

Keywords

Awards

Publisher

ieee

Conference_Titel

Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE

ISSN

1065-2221

Print_ISBN

978-1-4244-2123-7

Type

conf

DOI

10.1109/STHERM.2008.4509352

Filename

4509352